Researchers have developed a physics-based technique that accurately measures atomic-scale semiconductor defects, helping ...

Manijeh Razeghi, Walter P. Murphy Professor has been named Conference Chair of the Workshop on Defects in Wide Band Gap Semiconductors (WBG), which will be held on Monday, September 23, 2014 at the ...

Researchers at Sandia National Laboratories and Auburn University have developed a new method to more accurately detect ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Triply-twinned body-centred cubic lattices shift strut-scale deformation from bending to stretching, producing major gains in ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...